R.Sri Rama Devi, G.Prabhakar Rao, Usha Kiranmai |
||||||||||||
Partially Melted Zone in A356 Al-Si Alloy Welds-Effect of Technique and Prior Condition |
||||||||||||
Pressure die cast A356 Al-Si alloy with strontium modification was fusion welded by the continuous
current gas tungsten arc welding (CCGTAW) and pulsed current gas tungsten arc welding(PCGTAW)
techniques. Partially melted zone (PMZ) is an important region, as it is the weak link in the weldments. It is
significantly affected by the welding techniques used and prior condition of the alloy. In the present work, effect
of welding techniques on PMZ of A356 Al-Si alloy was studied. Microstructural changes in PMZ are related to
the welding techniques. Susceptibility to liquation was found to be less in the weld made in as cast condition
compared to that of artificially aged condition (T6). Resistance to liquation in PMZ was found to be better in as
cast condition of the alloy with pulsed current gas tungsten arc welding, when compared to continuous current
gas tungsten arc welding technique.
Partially Melted Zone in A356 Al-Si Alloy Welds-Effect of
Technique and Prior Condition.
[1]. Q. Han and S. Viswanathan, Microstructure Prediction in A356 Alloy Casting.Light Metals, 51 p. 609-
614. 2000.
[2]. T. Kobayashi, T. Ito, Q. Yao and N. Fatahalla, Fatigue Properties and Microstructure of Al-Si-Cu System Casting Alloys. Materials Science and Technology, 15: p. 1037-1043. 1999. [3]. S. Das, A. H. Yegneswaran and P. K. Rohatgi, Characterization of Rapidly Solidified Aluminum- Silicon Alloy. Journal of Materials Science, 22: p. 3173-3177. 1987. [4]. Y. L. Liu, S. B. Kang and H. W. Kim, The Complex Microstructures in an as- Cast Al-Mg-Si Alloy. Materials Letters, 41(12): p. 267-272, 1999. [5]. L. Backerud, G. Chai and J. Tamminen, Solidification Characteristics of Aluminum Alloys Vol. Volume 2: Foundry Alloys., Sewden: AFS, 1990.....
|
||||||||||||
J. Arun, S. Pravin Kumar, M. Venkatesh, A.S. Giridharan |
||||||||||||
Reliability Study on Spark Plugs Using Process Failure Mode and Effect Analysis | ||||||||||||
Failure Mode and Effect Analysis (FMEA) is a systematic tool for identifying the effects or
consequences of a potential product or process failure and to eliminate or reduce the chance of failure occurring.
The FMEA is a proactive approach in solving potential failure modes. Ideally, FMEAs are conducted in the
product design or process development stages, although conducting an FMEA on existing products and
processes can also yield substantial benefits. This paper provides the use of FMEA for improving the reliability
of spark plugs in order to ensure the engine efficiency which in turn improves the bottom line of automotive
industries. Thus the various possible causes and their effects along with the prevention are discussed in this
work. Severity rating, Occurrence rating, Detection rating and Risk Priority Number (RPN) are some
parameters, which are to be determined. These are the steps taken during the design phase of equipment to
ensure that the reliability requirements have been properly allocated and that a process for continuous
improvement exists. Here, the FMEA technique is applied on the spark plug operation and the defects are found.
This work serves as a failure prevention guide and also would improve the reliability of spark plug and thus
ensuring the effective vehicle performance.
FMEA, Spark Plug, Failure Modes, Severity rating, Occurrence rating, Detection rating, Risk
Priority Number.
[1]. V Janarthanan, D Rajenthira Kumar. Root Cause analysis & process failure mode and effect analysis of
TIG Welding on SS 3041 material (Proceeding of NC MISAA 2013, copyright 2013 PSGCT)
|
||||||||||||
Aru Okereke Eze, Prof. Ogbonnaya Okoro, Opara, F.K |
||||||||||||
The Computer Architecture of a Microcontroller Based Transistor Tester with a Logic Disp | ||||||||||||
This work exploits the design and implementation of a microcontroller based transistor tester with a
logic control. Microcontroller based transistor tester is a device used to test the electrical behaviour of transistors
and diode states within transistors. The transistor device is commonly used for circuitry and electronics. Most
transistor testers test whether or not a transistor is sinking input (NPN) or sourcing output (PNP). This work is
aimed at designing a microcontroller based transistor tester required to test Bipolar Junction Transistor, Field
Effect Transistor and Uni-junction Transistor. It is also aimed to experimenting and producing a well reliable
transistor, not only testing Bipolar, Field Effect and Uni-junction transistor but also other electronics component
useful in daily human lives.
Microncontroller, Transistor Tester, Liquid Crystal Display, Adc0804, Cpu, Rom, Ram, Etc.
[1]. J. Lim and A. Oppenheim (1988): Advanced Topics in Digital Processing. Prentice Hall limited,
New Delhi 2nd edition. Pg 567.
[2]. Edward Roll Tuft (1990): Principles of Information display. Graphic Press Canada, 3rd edition. Pg 890 and 989. [3]. B. BORAT (1997) : A course in digital processing Wiley 6th edition. Smith Publisher Washington. Pg 58-63 [4]. Lawrence A. Duarte (1998): The Microcontroller Beginner's Handbook. 2nd Edition. United States of America: Prompt Publication. pg 3-5. [5]. Joseph Greenfield (1999): Digital Electronic Design. Oxford University press 4th edition. Pg 89,567,905 and 1023.....
|
||||||||||||
Mrs. Minakshi R. Rajput |
Iris feature extraction and recognition based on different transforms |
This paper reviewed the literature regarding iris recognition. It explains need and significance of this
research .Hypothesis on iris recognition is also explored . Different stages of iris recognitions are also explained
and at the last it clarifies how Contoulet Transform is more admissible for iris feature extraction.
Biometrics,contourlet transform,feature extraction,iris recognition.
[1]. J. Daugman, ―How iris recognition works,‖ IEEE Trans. Circuits Syst. Video Technology., vol. 14, no. 1, pp.
21–30, 2004.
[2]. Chia-Te Chou, Sheng-Wen Shih,‖ Non-Orthogonal View Iris Recognition System‖, IEEE transactions on circuits and systems for video technology, vol. 20, no. 3, pp 417, March 2010. [3]. Shreyas Venugopalan,‖ How to Generate Spoofed Irises From an Iris Code Template‖, IEEE transactions on information forensics and security, vol. 6, no. 2, pp 10,11,23-27,June 2011. [4]. Yulin Si, Jiangyuan Mei, and Huijun Gao,‖ Novel Approaches to Improve Robustness, Accuracy and Rapidity of Iris Recognition Systems‖, IEEE transactions on industrial informatics, vol. 8, no. 1, pp.34-37,February 2012. [5]. Yung-Hui Li,‖ An Automatic Iris Occlusion Estimation Method Based on High-Dimensional Density Estimation‖, IEEE transactions on pattern analysis and machine intelligence, vol. 35, no. 4,pp.1-10, April 2013.... |
Prof. Ms. Neha D. Acharya |
Implimentation of SpaceWire Standard in SpaceWire CODEC using VHDL |
Spacewire is a relatively new data communication standard, specifically developed for space use. It
has been used in various mission of ESA, NASA; the current example is Lunar Reconnaissance Orbiter (LRO).
Use of standard interface can reduce the integration cost and allows reusability of developed product across
several missions. SpaceWire codec that encodes the user data in SpaceWire protocol format and decodes the
SpaceWire protocol format data has been developed using VHDL at register transfer level. Use of HDL based
development instead of chip based solution will help to achieve miniaturize design as the HDL development can be implemented in the same FPGA which is used for other functions of a given circuit block. One major limitation factor of standard asynchronous interfaces is the limitation on the accuracy and precision with which time synchronization between two subsystems can be achieved. Spacewire has provision for time codes to achieve some degree of isochronous operation. Using SpaceWire in the nominal way provides accuracy of synchronization depends on the transmitted clock frequency. Implimentation of SpaceWire Standard in SpaceWire
CODEC using VHDL.
[1]. ECSS E-ST-50-12C (Latest Version)- SpaceWire: Links, nodes, routers and networks – by ECSS, [6]. www.ccsds.org. |
M. H. Gulzar |
Location of Zero-free Regions of Polynomials |
In this paper we locate zero-free regions of polynomials when their coefficients are restricted to
certain conditions.
Mathematics Subject Classification: 30C10, 30C15 Coefficient, Polynomial, Zero.
[1]. K. K. Dewan, Extremal Properties and Coefficient estimates for Polynomials with restricted Zeros and
on location of Zeros of Polynomials, Ph.D. Thesis, IIT Delhi, 1980. |
J. Dhananandhini, C.M. Niranjana, K. Rajeswari, R.Karthick |
||||||||||||
Detecting Sensor Node Failure and Node Scheduling Scheme for Wsn | ||||||||||||
The Wireless Sensor Network is build of "nodes"- from a few to several hundreds or even
thousands, where each node is connected to one sensor. A node in a wireless sensor network that is capable of
performing some process and gather sensor information and communicating with other connected nodes in the
network. The nodes to perform transmissions not successfully, because there are some of the problems may
arise in that they are 1) if node failure will occur in any stage, 2) security issues arises due to transmission
involves number of nodes, 3) increasing transmission time due to more number of nodes will be active at a time
to complete a particular task. To solve this problem we propose new algorithms are 1) node sensing and node
failure for activity detection, 2) discovering routes and give security using neighbourhood keys, 3) which node
involves to perform the action that current node only to be active at a time other to be sleeping mode using node scheduling scheme. Wireless sensor networks, neighbourhood node, node failure, sensor node scheduling , faulttolerance,
Security.
[1]. Mokhtar Beldjehem " Toward a Multi-Hop, Multi-Path Fault-Tolerant and Load Balancing
Hierarchical Routing Protocol for Wireless Sensor Network" Wireless Sensor Network, 2013, 5, 215-
222
|
||||||||||||
Om Prakash, V. Upadhyay, A.K. Agrawal, P.N. Pandey |
||||||||||||
A Mathematical Model on the Two –Phase Hepatic Blood Flow in Arteriols with Special Refrence to Hepatitis B. | ||||||||||||
In the present paper we have formulated the Hepatic blood flow in Arteriols. Keeping in view the
nature of Hepatic circulatory system in human body. The viscosity increases in the arteoles due to formation of
Roulex along axis of red blood cells as we know that the arterioles are remote from heart and proximate to the
Liver. P.N. Pandey and V. Upadhyay have considered that the blood flow as two phased, one of which that of
red blood cells and other is plasma. They have also applied the Herschel bulkley Non-Newtonian modal in Bio
fluid mechanical setup. We have collected a clinical data in case of Hepatitis B for Hematocrit versus blood
pressure. The graphical presentation for a particular paramatic value is very close to the clinical observation.
The overall presentation is in tensorial form and the solution technic adopted are in analytical as well as
numerical. The role of hematocrit is explicit in the determination of blood pressure in case of Hepatic disease
Hapatitus B.
A Mathematical Model on the Two –Phase Hepatic Blood
Flow in Arteriols with Special Refrence to Hepatitis B.
[1]. Berkow, Robert, ed. Merck Manual of Medical Information. Whiehouse Station, NJ:Merck
Research Laboratories, 1997.
[2]. A.K. Berry, A.S.kapoor, R. Nagabhushanam, Animal phisiology, 1981. [3]. Whynne HA, Cope L.H. Mutch E at al. The effectb of age upon liver, 9,297-301, 1989. [4]. Cirrhosis overview National Digestive Information Clearing house, Retrieved on 01-22, 2010. [5]. Dienstag JL, Hepatitis vairus infection, N Engel j med. 359; 1486-1500, 2008....
|
||||||||||||